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      Nicomp 380 ZLS 納米激光粒度儀及ZETA電位分析儀

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      • 公司名稱奧法美嘉科技有限公司
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      • 更新時(shí)間2022/10/22 12:03:10
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      公司概況(Company Profile)

       

      奧法美嘉科技有限公司

       

      奧法美嘉(Alpharmaca)科技有限公司于2010年在上海成立,立足于醫(yī)藥行業(yè),耕耘于納米科學(xué)材料,化工,半導(dǎo)體,環(huán)境科學(xué),汽車,過濾,涂料,墨水,油品等行業(yè),以專業(yè)的納米微米檢測技術(shù),“致力粒度分析,專注客戶體驗(yàn)”。這已經(jīng)成為奧法美嘉團(tuán)隊(duì)的信條。

      借助于20多年的行業(yè)積累和技術(shù)儲備,奧法美嘉將世界上處于技術(shù)地位的美國PSS粒度儀公司的激光粒度儀產(chǎn)品引入到中國市場,秉承著“傳授粒度真知”“普及粒度知識”的理念,伴隨著納米知識的普及,伴隨著中國經(jīng)濟(jì)向制造業(yè)的轉(zhuǎn)型,經(jīng)過短短幾年,奧法美嘉科技有限公司作為美國PSS粒度儀公司在中國的代表,從中心的建立運(yùn)營,到如今覆蓋全中國銷售網(wǎng)絡(luò)和售后服務(wù)網(wǎng)絡(luò),不僅用真誠的態(tài)度,而且用務(wù)實(shí)的專業(yè)知識,真正踐行“|專注|粒度分析”的承諾,獲得了廣大客戶的。

      Particle Solutions srl(意大利PSI均質(zhì)機(jī)公司)位于意大利海濱工業(yè)城鎮(zhèn)拉齊奧地區(qū),毗鄰歷史悠久的古城羅馬,由從事粒度相關(guān)領(lǐng)域內(nèi)杰出的歐洲科學(xué)家以及工程師所組成的團(tuán)隊(duì)發(fā)起創(chuàng)立。公司團(tuán)隊(duì)擁有25年粒度檢測知識積累,15年儀器工業(yè)設(shè)計(jì)經(jīng)驗(yàn),15年高壓均質(zhì)技術(shù)經(jīng)驗(yàn)及應(yīng)用研究。

      通過深入發(fā)掘客戶需求和應(yīng)用難點(diǎn),PSI團(tuán)隊(duì)研發(fā)出了新型高壓微射流均質(zhì)機(jī),其穩(wěn)定可控的均質(zhì)壓力及高剪切力保證了工藝可線性放大且可保證大產(chǎn)量需求,低噪音的設(shè)計(jì)理念可大大減緩傳統(tǒng)工藝中的高噪音對于操作人員的不利影響,小巧緊湊的機(jī)身設(shè)計(jì)可以適應(yīng)從實(shí)驗(yàn)室研發(fā)到中試及大生產(chǎn)的各種工作場景。自組建以來,團(tuán)隊(duì)累積了大量醫(yī)藥,生物,半導(dǎo)體,新材料等行業(yè)的相關(guān)應(yīng)用經(jīng)驗(yàn)。依托于醫(yī)藥行業(yè)*的GMP管理理念,PSI均質(zhì)機(jī)的現(xiàn)代化數(shù)字屏幕,符合GMP法規(guī)的數(shù)據(jù)溯源系統(tǒng)將會成為未來制造業(yè)的有力保障。

      現(xiàn)奧法美嘉綜合PSS粒度儀和PSI均質(zhì)機(jī),為中國制造業(yè)提供納米技術(shù)領(lǐng)域內(nèi)從生產(chǎn)研發(fā)設(shè)備到檢測儀器的整套解決方案。

       

      企業(yè)文化(Company Philosophy)

       

      “共享 共建 共發(fā)展”“求誠 求信 求真知”

       

      現(xiàn)代企業(yè)的發(fā)展趨勢為規(guī)范化、專業(yè)化、文明化、個(gè)性化。伴隨著中國經(jīng)濟(jì)的快速發(fā)展和騰飛,中國社會的各個(gè)層面在發(fā)生翻天覆地的變化,“中國制造”的標(biāo)簽也會逐漸演變?yōu)椤爸袊鴦?chuàng)造”。而企業(yè)的發(fā)展創(chuàng)造依靠的就是人才!人才是一切發(fā)展的基石和動(dòng)力。這反過來對“人才”從素養(yǎng),知識,認(rèn)知,理念等各方面提出了新的要求和高度。

      奧法美嘉一直秉承“共享 共建 共發(fā)展”的用人理念,“求誠 求信 求真知”的做事理念。在尋求高素質(zhì)人才的同時(shí),更加注重于已入職員工的培養(yǎng)。員工入職從最基礎(chǔ)的醫(yī)藥行業(yè)準(zhǔn)入知識開始培訓(xùn),覆蓋知識技能培訓(xùn),商務(wù)技能培訓(xùn),職業(yè)規(guī)劃到人生規(guī)劃。公司的目標(biāo)之一是希望每個(gè)人都能成為合格的項(xiàng)目經(jīng)理,成為一名有理想有追求有素養(yǎng)的專業(yè)職場人,且能夠獨(dú)當(dāng)一面,實(shí)現(xiàn)自己的人生價(jià)值!


      DynamicLightScatteringTheNicomp380SubmicronParticleSizeAnalyzerusestheprincipleofDynamicLightScattering(DLS)toobtainthepartcilesizedistributionofcolloidalsystemswhosesizesrangefrom0
      Nicomp 380 ZLS 納米激光粒度儀及ZETA電位分析儀 產(chǎn)品信息
    1. Dynamic Light Scattering

      Nicomp with AT-4.jpg

      The Nicomp 380 Submicron Particle Size Analyzer uses the principle of Dynamic Light Scattering (DLS) to obtain the partcile size distribution of colloidal systems whose sizes range from 0.5 nanomters to 6 microns. DLS works by illuminating a group of particles in suspension with a focused laser beam which gives rise to many scattered light waves. These waves interfere with each other and produce a net scattered intensity that fluctuates as a function of time at some distant detector. Diffusion, or Brownian motion, of the particles causes random variations in the phases of the individual waves, resulting in a fluctuating light intensity. The particle size distribution can be obtained by analyzing the time behavior of these fluctuations using an autocorrelator. The autocorrelation function for a single uniform size distribution is a decaying exponential function where particle diffusivity is easily obtained from the decay time. Finally the particle radius can easily be calculated using the Stokes-Einstein relationship.

      In general most samples are not uniform instead they are quite often polydisperse, having a range of particle sizes. The autocorrelation function then consists of a combination of decaying exponential functions, each having a different decay time and the analysis of the autocorrelation function is no longer quite simple. The instrument using varying deconvolution algorithms must invert the raw data in order to arrive at the best estimate of the true particle size distribution. The Nicomp excels at characterizing these difficult particle size distributions by utilizing a group of unique deconvolution algorithms ranging from a simple Gaussian approximation to a proprietary high resolution multi-modal deconvolution analyses called the “Nicomp Distribution".

      Some of the unique features found on Gaussian analysis mode is a baseline adjust parameter which provides aggregate compensation that excedes the sensitivity found on most other instruments which employ a dust or dirt factor. The Gaussian analysis mode also allows for the user to specify a solid or vesicle weighting mode for analysing thin walled colloidal systems like liposomes. The Nicomp Analysis Mode is a proprietary high-resolution deconvolution algorithm that was first introduced over 25 years ago. It has historically proven its ability to accurately analyze even the most difficult closely spaced bimodals (e.g. 2:1 apart) and even certain trimodal distributions. This is extremely useful in finding the native peak of the aggregate distribution.

      The standard Nicomp 380 is equipped with a 12 mW laser diode and PMT detector with an optical fiber set to 90°. Sample is introduced with drop-in cells.The 380 is the only Dynamic Light Scattering Instrument designed using a modular approach. Its capabilities may be enhanced by adding one or more modules:

      Autodilution

      This patented module eliminates the need for manual dilution of concentrated sample. Autodilution makes particle size analysis quick and easy, with no training required. Results are highly reproducible.

      380/HPLD High Power Laser Diodes

      PSS offers an array of high power laser diodes to meet the needs of our most demanding applications. Higher power lasers are needed to extend the lower limit of our instrument by providing adequate scattering from small particles. They are also useful when measuring large particles such as dextrans, which yield insufficient scattering intensity because of index of refraction properties. The result is a more versatile instrument, ideal for sizing microemulsions, surfactant micelles, proteins and other macromolecules. It can even estimate the extent of aggregration of biopolymers after reconstitution, without chromatographic separation.

      Avalanche Photo Diode (APD) Detector

      The Nicomp 380 can be equipped with various high-powered lasers as well as a high-gain Avalanche Photo Diode Detector (APD which provides approximately seven times the gain of a conventional photomultiplier tube. The APD is used to increase signal-to-noise and sensitivity in systems that do not scatter light well. Proteins, micelles, other macro-molecular-based systems, and nanoparticles are often dilute (1 mg/ml or less) and are made of atoms that do not scatter light well. The Avalanche Photo Diode coupled with a nominally higher powered laser diode module offers a low cost solution for accurately analyzing nanoparticles in a short period of time.

      380/MA Multi-angle Goniometer

      Particles larger than 100 nm do not scatter light isotropically in all directions. It is possible to make DLS measurements more sensitive to certain sized particles by changing the angle of detection. The Nicomp 380 can be equipped with a mini-goniometer that moves the optical fiber between 12° and 175° by 0.9° increments.

      Zeta Potential

      The Nicomp 380/ZLS is designed to measure the electrophoretic mobility and zeta potential of charged particles in liquid suspension. The main reason to measure zeta potential is to predict colloidal stability. The interactions between particles play an important role in colloidal stability. The use of zeta potential measurements to predict stability is an attempt to quantify these interactions. The zeta potential is a measure of the repulsive forces between particles. Since most aqueous colloidal systems are stabilized by electrostatic repulsion, the larger the repulsive forces between particles, the less likely they will be to come close together and form aggregates. Thus the more stable a colloid will be. The Nicomp 380/ZLS combines the techniques of Dynamic Light Scattering (DLS) and Electrophoretic Light Scattering (ELS) to measure both sub-micron particle size distributions and zeta potentials in one compact instrument.

      The Nicomp 380/ZLS uses the method of Electrophoretic Light Scattering (ELS) to measure Zeta potential. To make a measurement, a small aliquot of sample is typically placed in a disposable plastic cuvette. Then the palladium electrodes are inserted. The entire cell is placed into the Nicomp 380. Because of the unique cell design, there is no need to align the cell to the stationary plane. After the cell is in place, a simple click of the mouse starts the measurement. Since ELS requires the use of heterodyned light, the scattered light must be properly mixed with a reference beam (split off from the incident light beam) prior to entering the detector. The software will begin a measurement by automatically adjusting the incident light intensity to optimize the mixing between the scattered light and the reference beam. Once this is completed, a reference power spectrum is measured while the electric field is off. Then the electric field is applied and another power spectrum is measured. The change in the frequency of the peak in this power spectrum when compared to the reference spectrum is the Doppler shift. The Doppler shift is used to calculate the average mobility. Using the Smoluchowski equation, the zeta potential is determined.

      Autotitrator

      The Autoitrator module gives the Nicomp 380/ZLS the ability to automatically make multiple measurements on the same sample over a series of different pH's or ionic concentrations. This allows iso-electric points to be determined.

      Phase Analysis Light Scattering (PALS)

      The use of Phase Analysis (instead of the standard amplitude analysis) allows for the more accurate and precise measurement of small Doppler shifts. This means that zeta potential measurements can be made in high ionic strength or high dielectric environments (like alcohols and organic solvents).


    2. 詳情請參考Nicomp 380 Z3000。點(diǎn)擊跳轉(zhuǎn)

    3. 詳情請參考Nicomp 380 Z3000。點(diǎn)擊跳轉(zhuǎn)

    4. 詳情請參考Nicomp 380 Z3000。點(diǎn)擊跳轉(zhuǎn)

    5. 詳情請參考Nicomp 380 Z3000。點(diǎn)擊跳轉(zhuǎn)

    6. 尊敬的用戶您好,在對儀器還不了解的情況下,為了讓您可以選擇一款適合貴單位的設(shè)備,可以先寄送樣品到我們公司,由我們的技術(shù)人員幫您測試樣品,并將測試結(jié)果和數(shù)據(jù)報(bào)告發(fā)送到您郵箱或者將紙質(zhì)版寄送到貴單位。

      下方鏈接是測試申請表,請下載填寫完整后隨樣品一起寄送過來。

      下載鏈接在這里郵寄地址:中國上海閔行區(qū)漕河涇浦江高科技園 F區(qū) 新駿環(huán)路588號23幢402室

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    7. Nicomp 380 系列彩頁
      序號文件類型下載鏈接
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      PSS_380合集_Brochures_CN_v3.0

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      PSS_N3000_納米粒度儀_flyer_CN_v4.0

      3PDF_512px_1184255_easyicon.net.png

      PSS_Z3000_納米粒度及Zeta電位分析儀_flyer_CN_v4.0

      4PDF_512px_1184255_easyicon.net.png

      PSS_Nicomp_3000_粒度分析儀系列_Brochures_V4.4



      AccuSizer 780 系列彩頁
      序號文件類型下載鏈接
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      PSS_780合集_Brochures_CN_v3.0

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      PSS_不溶性微粒專題_flyer_CN_v3.0

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      PSS_粒度儀在醫(yī)藥行業(yè)的應(yīng)用_flyer_CN_v3.0

      4PDF_512px_1184255_easyicon.net.png

      PSS_A2000_SIS_不溶性微粒檢測儀_flyer_CN_v4.0

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      PSS_A7000_APS_大乳粒檢測儀_flyer_CN_v4.0

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      PSS_A7000_AD_多功能自動(dòng)計(jì)數(shù)粒度儀_flyer_CN_v4.0

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      PSS_FMS_flyer_CN_v3.0

      8

      PDF_512px_1184255_easyicon.net.png

      PSS_AccuSizer_2000_不溶性微粒分析儀系列_Brochures_V4.4

      9PDF_512px_1184255_easyicon.net.pngPSS_AccuSizer_7000_計(jì)數(shù)粒度分析儀系列_Brochures_V4.4
      10PDF_512px_1184255_easyicon.net.pngPSS_AccuSizer_9000_高濃度納米顆粒計(jì)數(shù)器系列_Brochures_V4.4
      11PDF_512px_1184255_easyicon.net.pngPSS_FMS_在線粒度儀系列_Brochures_V4.4






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