騰達(dá)試驗(yàn)儀器廠;

　　一、產(chǎn)品簡(jiǎn)介：

　　C84-III反射率測(cè)定儀是**涂層檢測(cè)儀器，可用于漆膜遮蓋力的測(cè)定。

　　全符合國(guó)際標(biāo)準(zhǔn)ISO3906-1980(E)、**標(biāo)準(zhǔn)GB/T13452.3-92、GB9270-88、GB5211.17-88對(duì)該儀器的規(guī)定要求。

　　Product introduction:

　　The C84-III reflectance tester is a coating testing instrument that can be used to determine the hiding power of paint films.

　　In full compliance with the international standards ISO3906-1980(E),**standards GB/T13452.3-92,GB9270-88,GB5211.17-88 requirements for this instrument.

　　二、技術(shù)參數(shù)：

　　1、測(cè)量范圍0~100

　　2、重復(fù)精度0.3%

　　3、顯示數(shù)據(jù)與反射光強(qiáng)度成正比

　　4、儀器的光普靈敏度近似等于Sc與Y的乘積

　　5、環(huán)境溫度20°±5°相對(duì)濕度<85%

　　6、輸入電源220V±10%50Hz

　　7，外形尺寸：180X210X470mm

　　8,重量：7kg

　　Technical parameters:

　　1.Measuring range:0~100

　　2.Repeatability 0.3%

　　3.The display data is proportional to the reflected light intensity

　　4.The optical sensitivity of the instrument is approximately equal to the product of Sc and Y

　　5.Ambient temperature 20°±5°Relative humidity<85%

　　6.Input power 220V±10%50Hz

　　7.Dimensions:180X210X470mm

　　8,weight:7kg

　　三、工作原理：

　　本儀器由探頭、主體、標(biāo)準(zhǔn)板（黑白各一塊）、工作陶瓷板(黑白各兩塊)等組成。

　　Third,the working principle:

　　The instrument consists of a probe,a main body,a standard board(one black and white each),ａnd a working ceramic board(two black and white each).

　　探頭采用0°照射，漫反射接收的原理。當(dāng)試樣的反射光作用于硒光電池表面產(chǎn)生電訊號(hào)輸入到直流放大器進(jìn)行放大，并予以讀數(shù)顯示（詳見(jiàn)光路原理圖及儀器框圖）。

　　The probe adopts the principle of 0°illumination and diffuse reflection reception.When the reflected light of the sample acts on the surface of the selenium photocell,the electrical signal is input to the DC amplifier for amplification and readout display(for details,see the schematic diagram of the optical circuit and the block diagram of the instrument).

　　四、使用方法：

　　1、把探頭與電控箱連接，同時(shí)接上電源，開(kāi)機(jī)預(yù)熱10-15分鐘。此時(shí)應(yīng)把探頭放在黑色標(biāo)準(zhǔn)板上為佳。

　　2、校零：把探頭放在白色標(biāo)準(zhǔn)板上，調(diào)整主機(jī)上的校零旋鈕，使主機(jī)數(shù)字顯示為000.0，允許變動(dòng)±0.1.

　　3、校正標(biāo)準(zhǔn)值：把探頭放在白色標(biāo)準(zhǔn)板上，調(diào)整主機(jī)的校標(biāo)旋鈕，使主機(jī)顯示的數(shù)值與白色標(biāo)準(zhǔn)板的標(biāo)定一致。允許變動(dòng)±0.1反復(fù)調(diào)整一次（校零、校標(biāo)）。

　　4、測(cè)量RB值：把探頭移至放有試樣的黑色工作陶瓷板上，顯示器所顯示的數(shù)值即為RB值。

　　5、測(cè)量RW值：把探頭移至放有試樣的白色工作陶瓷板上，顯示器所顯示的數(shù)值即為RW值。

　　6、計(jì)算求得對(duì)比率對(duì)比率（遮蓋率）=RB/RW×a

　　Fourth,use method:

　　1.Connect the probe to the electric control box,connect the power supply at the same time,ａnd warm up for 10-15 minutes after starting.It is better to place the probe on the black standard board.

　　2.Zero calibration:Put the probe on the white standard board,ａnd adjust the zero calibration knob on the host to make the host's digital display as 000.0,allowing the variation±0.1.

　　3.Calibration standard value:Put the probe on the white standard board and adjust the calibration knob of the host to make the value displayed by the host consistent with the calibration of the white standard board.Allowed to adjust±0.1 repeatedly(zero calibration,calibration).

　　4.Measure RB value:Move the probe to the black working ceramic plate on which the sample is placed,ａnd the value displayed on the display is the RB value.

　　5.Measure RW value:Move the probe to the white working ceramic plate on which the sample is placed,ａnd the value displayed on the display is the RW value.

　　6.Calculate the contrast ratio.Contrast ratio(coverage ratio)=RB/RW×a

　　五、注意事項(xiàng)：

　　1、為保證測(cè)量精度，測(cè)量環(huán)境溫度應(yīng)接近25°C。儀器應(yīng)經(jīng)常校準(zhǔn)，允許偏差為±0.3，若大于0.3需要新校準(zhǔn)。

　　2、為克服硅光電池的光照疲勞現(xiàn)象，在測(cè)試的間隙時(shí)間內(nèi)應(yīng)將探頭放在黑色標(biāo)準(zhǔn)板上面。減少插頭的拔插次數(shù)，以免損壞插頭，造成接觸不良。

　　3、白色標(biāo)準(zhǔn)版應(yīng)遠(yuǎn)離污染，否則會(huì)影響測(cè)量精度。如有污漬可用**繪圖橡皮除凈。

　　4、試樣的制備應(yīng)嚴(yán)格依照相關(guān)的**標(biāo)準(zhǔn)GB9271-88的規(guī)定進(jìn)行。

　　Five,matters needing attention:

　　1.In order to ensure the measurement accuracy,the measurement ambient temperature should be close to 25°C.The instrument should be calibrated frequently with a tolerance of±0.3.If it is greater than 0.3,a new calibration is required.

　　2.In order to overcome the light fatigue phenomenon of the silicon photocell,the probe should be placed on the black standard board during the interval of the test.Reduce the number of plugs to remove,so as not to damage the plug and cause poor contact.

　　3.The white standard version should be kept away from pollution,otherwise it will affect the measurement accuracy.If there are stains,you can use the advanced drawing eraser to clean it.

　　4.The preparation of samples should be strictly in accordance with the relevant**standard GB9271-88.